The Wave WAA-1300-GE-TEC combines visible and short-wave infrared (SWIR) sensitivity in a single camera, enabling enhanced material contrast, improved defect detection, and more reliable inspection results. With sensitivity from 400 nm to 1700 nm, the camera can reveal features and material characteristics that may not be visible using standard imaging technologies.
Applications
Semiconductor alignment:
SWIR sees through silicon layers to find alignment marks. This enables precision through successive process layers. Image courtesy of JAI.
Fruit and vegetable sorting:
VIS + SWIR working together can identify bruising, ripeness levels, early spoilage, and more. Image courtesy of JAI.
Laser beam profiling:
SWIR enables measuring beam shape, intensity distribution, and alignment. Image courtesy of JAI.
Recycling and material sorting:
In VIS two clear plastic bottles might appear the same, but SWIR can see their different response in it’s portion of the spectrum – allowing different handling. SWIR enables measuring beam shape, intensity distribution, and alignment. Image courtesy of JAI.
Utilize diverse spectral responses to your advantage
The application areas above are just representative, and are not meant to be exhaustive. The key point is that diverse materials provide differing spectral responses under appropriate light (including natural light).
Applications may be designed to identify and differentiate materials according to their spectral properties. Sensors, cameras, lighting, and lenses are available for machine vision applications that draw upon each of UV, VIS, IR, NIR, SWIR, MWIR, and LWIR portions of the spectrum. And combinations thereof – like the VisSWIR JAI Wave WAA-1300-GE-TEC.
1st Vision’s sales engineers have over 100 years of combined experience to assist in your camera and components selection. With a large portfolio of cameras, lenses, cables, NIC cards and industrial computers, we can provide a full vision solution!
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