Teledyne Vision Solutions Forge 1GigE SWIR cameras combine high-performance short-wave infrared (SWIR) imaging with the reliability of GigE Vision technology for demanding industrial machine vision applications. Built around advanced Sony SenSWIR InGaAs sensor technology, Forge SWIR cameras deliver exceptional image quality across both the visible and SWIR spectrum from approximately 400 nm to 1700 nm.

Designed for applications where conventional visible-light cameras cannot reliably detect material differences, moisture content, contaminants, or hidden defects, Forge SWIR cameras enable advanced inspection and imaging in semiconductor, electronics, food inspection, recycling, solar, scientific, and industrial automation applications.

The GigE Vision interface supports long-distance cable deployment, reliable data transmission, and simplified integration into new and existing machine vision systems. Combining high sensitivity, compact design, and advanced onboard imaging features, Forge SWIR cameras provide a flexible solution for industrial SWIR imaging and automation.

Compatibility with GigE Vision-compliant software, the Teledyne Spinnaker SDK, and Sapera software simplifies system integration and supports dependable image acquisition in complex industrial environments.

Teledyne DALSA is part of Teledyne Vision Solutions, a global group of machine vision and imaging brands under Teledyne Technologies.

Features & Benefits

• SWIR imaging from approximately 400 nm to 1700 nm for enhanced material detection
• Sony SenSWIR InGaAs sensors deliver high-sensitivity, low-noise imaging
• GigE Vision interface enables reliable long-distance industrial connectivity
• Global shutter captures distortion-free images of fast-moving objects

Typical Applications

• Semiconductor wafer and electronics inspection
• Food sorting and agricultural inspection
• Moisture detection and contamination analysis
• Solar cell and photovoltaic inspection
• Recycling and material sorting systems
• Industrial quality control and automation
• Pharmaceutical inspection
• Scientific and laboratory imaging
• Surveillance and low-light imaging
• Silicon inspection and packaging analysis