The JAI WAL-2001-GE is a high-resolution GigE 2K SWIR line scan camera with an InGaAs sensor designed for demanding industrial inspection applications requiring exceptional sensitivity and fine defect detection. Its innovative dual-line pixel-shift architecture produces 2K output while maintaining compatibility with standard C-mount optics. Combined with GigE Vision connectivity, large 12.5µm pixels, line rates up to 40 kHz, and high-sensitivity InGaAs imaging, the WAL-2001-GE is ideal for semiconductor inspection, food processing, recycling, electronics manufacturing, and material sorting.

JAI Wave SWIR cameras are designed for high-speed industrial machine vision applications such as inspection, sorting, and moisture analysis. They are available in various configurations that includes area and line scan cameras, GigE or Camera Link interfaces, multispectral or monochrome, SWIR and Visible + SWIR models.